Minutes, IBIS Quality Committee

24 November 2009

11-12 AM EST (8-9 AM PST)

ROLL CALL
  Adam Tambone
  Anders Ekholm, Ericsson
  Barry Katz, SiSoft
  Benny Lazer
  Benjamin P Silva
  Bob Cox, Micron
  Bob Ross, Teraspeed Consulting Group
  Brian Arsenault
  David Banas, Xilinx
* Eckhard Lenski, Nokia Siemens Networks
  Eric Brock
  Guan Tao, Huawei Technologies
  Gregory R Edlund
  Hazem Hegazy
  Huang Chunxing, Huawei Technologies
  John Figueroa
  John Angulo, Mentor Graphics
  Katja Koller, Nokia Siemens Networks
  Kevin Fisher
  Kim Helliwell, LSI Logic
* Lance Wang, IOMethodology
  Lijun, Huawei
  Lynne Green, Green Streak Programs
* Mike LaBonte, Cisco Systems
  Mike Mayer, SiSoft
* Moshiul Haque, Micron Technology
  Muniswarareddy Vorugu, ARM Ltd
  Pavani Jella, TI
  Peter LaFlamme
  Randy Wolff, Micron Technology
  Radovan Vuletic, Qimonda
  Robert Haller, Enterasys
  Roy Leventhal, Leventhal Design & Communications
  Sherif Hammad, Mentor Graphics
* Tim Coyle, Signal Consulting Group
  Todd Westerhoff, SiSoft
  Tom Dagostino, Teraspeed Consulting Group
  Kazuyoshi Shoji, Hitachi
  Sadahiro Nonoyama

Everyone in attendance marked by *

NOTE: "AR" = Action Required.

-----------------------MINUTES ---------------------------
Mike LaBonte conducted the meeting.

Call for opens and patent disclosures:

- No one declared a patent.

- Mike: There will be no meeting Dec 8

AR Review:

- Mike notify ibis and ibis-quality lists about correlation discussions
  - No email yet

- Moshiul rework IQ checklist for IQ 2.0
  - Not done yet
  - Mike: Bita Edwards from Motorola had inquired if this would be updated

New items:

Mike showed the IBIS Healing Tool:
- It fixes some but not all problems found in IBIS files
- Moshiul: Can it convert an IBIS file to 4.2 with new features?
- Mike: No, it only changes the [IBIS ver]
- Moshiul: There is some tool out there to help with that
- Mike: Ordinarily IBIS tools are only able to add limited IBIS keywords
  - C_comp, I-V and V-T tables beginning with IBIS 2.1
  - Golden waveforms beginning with IBIS 3.1
  - Current waveforms beginning with IBIS 5.0
  - Everything must be input from the datasheet or other sources

Correlation:
- Mike: We looked at the Accuracy Handbook last week
- Tim: There should be a balance between being powerful and useful
  - It should have mfg test loads from the datasheet
  - Also some basic tline fixtures
  - The Accuracy Handbook has its Figure of Merit
  - David and Roy did Feature-Selective Verification
    - This is basically what is used for my work
  - Vendors have trouble understanding what loads to use
    - Some provide overlay waveforms without much analysis in quality reports
- Lance: Feature-Selective Verification tries to break it down to separate parameters?
- Tim: Yes
- Lance: People need to know how good the whole file is
- Tim: Good point
  - Vendors have to decide what they are comfortable with
- Mike: Is there a need for a standardized quality reports?
- Moshiul: No one has asked for that
  - They want to see some kind of correlation
- Mike: Will users want IC vendors to test in every simulator?
- Tim: It shouldn't have to be tested in every IBIS simulator
- Mike: There are differences between IBIS simulators
  - It depends on the model contents
- Moshiul: Users only care that it works in the tool they are using
- Lance: People who use a different simulator need to validate
- Eckhard: We do the usual checks on incoming models
  - For correlation we try an overlay
  - Sim results against built-in waveforms
- Tim: Vendors are not likely to release models with [Test Data]
  - Accuracy issues might be exposed
- Mike: Bob Ross noted that [Test Data] adds greatly to the file size
  - Also there is no support for input stimulus patterns
- Tim: There may be some enhancements related to that
- Mike: We should discuss test fixtures
  - Most agree that a T-line fixture is needed
- Tim: I could give a presentation on using test data and correlation

Meeting ended at 11:58 PM Eastern Time.
